Abstract
Optical frequency domain reflectometry (OFDR) is a very attractive technique for the characterization of optical network and components because of its high spatial resolution and high sensitivity.
© 1999 Optical Society of America
PDF ArticleMore Like This
M. Yoshida, K. Nakmura, and Hiromasa Ito
CWK41 Conference on Lasers and Electro-Optics (CLEO:S&I) 2000
Koichiro Nakamura, Takefumi Hara, Masato Yoshida, and Hiromasa Ito
CMD8 Conference on Lasers and Electro-Optics (CLEO:S&I) 1999
Xinyu Fan and Fumihiko Ito
ATh4D.3 Asia Communications and Photonics Conference (ACP) 2013