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Optica Publishing Group
  • Journal of Lightwave Technology
  • Vol. 26,
  • Issue 13,
  • pp. 1891-1900
  • (2008)

Fabrication and Characterization of Temperature Insensitive 660-nm Resonant-Cavity LEDs

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Abstract

InGaP/AlGaInP 660-nm resonant-cavity light-emitting diodes (RCLEDs) with stable temperature characteristics have been achieved by extending the resonant cavity length from one optical wavelength (1λ) to three optical wavelengths (3λ) and tripling the number of quantum wells. When the operation temperature increases from 25 °C to 95 °C, the degree of power variation at 20 mA is reduced from -2.1 dB to -0.6 dB for the conventional 1-λ cavity RCLEDs and 3-λ cavity RCLEDs, respectively. In order to interpret the temperature-dependent experimental results, advanced device simulation is applied to model the RCLEDs with different cavity designs. According to the numerical simulation results, we deduce that the stable temperature-dependent output performance should originate from the reduction of electron leakage current and thermally enhanced hole transport for the 3-λ cavity AlGaInP RCLEDs.

© 2008 IEEE

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