Measurement of polarization-dependent loss mechanisms in Cr4+:YAG

Hua Liu; Judith Dawes; Peter Dekker; James Piper

doi:10.1364/ASSP.2003.210

Advanced Solid-State Photonics
OSA Trends in Optics and Photonics (Optica Publishing Group, 2003),
paper 210
•https://doi.org/10.1364/ASSP.2003.210

Measurement of polarization-dependent loss mechanisms in Cr⁴⁺:YAG

Hua Liu, Judith Dawes, Peter Dekker, and James Piper

Advanced Solid-State Photonics 2003

San Antonio, Texas United States
2–5 February 2003
ISBN: 1-55752-743-1

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Poster Session II (PSII)

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H. Liu, J. Dawes, P. Dekker, and J. Piper, "Measurement of polarization-dependent loss mechanisms in Cr4+:YAG," in Advanced Solid-State Photonics, J. Zayhowski, ed., Vol. 83 of OSA Trends in Optics and Photonics (Optica Publishing Group, 2003), paper 210.

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Abstract

Using a polarized pump-probe technique, we studied the continuous-wave absorption and emission polarization anisotropy of Cr⁴⁺:YAG crystals and modeled the ground state absorption and excited state absorption loss. We propose a twisted mode laser cavity to compensate for this anisotropic loss and achieve narrow linewidth output.

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