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Conferences > CLEO_AT > 2013 > JTu3B > JTu3B.1

Coherent EUV High Harmonic Sources for Applications in Imaging, Materials Dynamics and Nanometrology

Tenio Popmintchev, Daniel Adams, Matthew Seaberg, Damiano Nardi, Kathy Hoogeboom-Pot, Henry Kapteyn, and Margaret Murnane

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Abstract

Coherent high harmonic light sources in the extreme ultraviolet and soft x-ray region are ideally suited for range of nano-imaging, nano-metrologies, and dynamic measurements of materials, thin film and magnetic samples.

© 2013 Optical Society of America

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