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Characterization of the Nonlinear Susceptibility of Monolayer MoS2 using Second- and Third-Harmonic Generation Microscopy

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Abstract

Second- and third-harmonic generation microscopy of monolayer MoS2 is reported for imaging and characterization of the material’s nonlinearity. A telecommunication wavelength pump is used, revealing the material’s promise for use in nonlinear optical devices.

© 2016 Optical Society of America

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