Author Affiliations

Shoufeng Lan,¹ Xiaomu Wang,² Sean Rodrigues,^1,3 Luohao Wang,⁴ Yonghao Cui,³ Han Wang,⁴ Fengnian Xia,^2,* and Wenshan Cai^1,3,*

¹School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332

²Department of Electrical Engineering, Yale University, New Haven, CT 06511

³School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332

⁴Ming Hsieh Department of Electrical Engineering, University of Southern California, Los Angeles, CA 90089

^*Corresponding author: wcai@gatech.edu, fengnian.xia@yale.edu