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Electro-Optical Active Barium Titanate Thin Films in Silicon Photonics Devices

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Abstract

We demonstrate the integration of single-crystalline barium titanate thin films on silicon substrates, with Pockels coefficients of rEff ~ 148 pm/V. We further show the implementation of such layers into silicon photonic devices such as ring resonators.

© 2013 Optical Society of America

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