Abstract

We describe a novel instrument combining interferometric scattering microscopy (iSCAT) with confocal Raman microscopy. This system images the refractive index morphology of a complex material on a 200 nm length scale over a 100 µm wide-field sampled at a frequency exceeding 50 frames per second. Co-axial Raman sampling provides point-by-point label-free chemical information of selected features with a similar degree of spatial resolution and a high degree of reproducibility. This system offers promise for the non-destructive label-free classification of a wide range of natural materials.

© 2015 Optical Society of America