Abstract
We report the reduction of sidelobes in tight focusing patterns of radially higher-order Laguerre–Gaussian (LG) beams with nonhelical phase structures. Numerical calculations based on the vectorial Debye theory reveal that a class of annular masks reduces sidelobes in the tight focusing patterns only for radially even-order LG beams. The present scheme produces small focal spots beyond the diffraction limit suitable for application to scanning microscopy, laser fine processing, etc.
© 2008 Optical Society of America
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