Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
  • Imaging and Applied Optics 2018 (3D, AO, AIO, COSI, DH, IS, LACSEA, LS&C, MATH, pcAOP)
  • OSA Technical Digest (Optica Publishing Group, 2018),
  • paper 3M3G.4
  • https://doi.org/10.1364/3D.2018.3M3G.4

Grid-based oneshot scan using dot-line pattern

Not Accessible

Your library or personal account may give you access

Abstract

Oneshot scanning technique which is robust to subsurface scattering is proposed. The pattern consists of parallel lines, where dotted lines and solid lines are alternatively aligned. Experimental results of scanning real objects are shown to prove the effectiveness.

© 2018 The Author(s)

PDF Article
More Like This
FPGA-based high-speed real-time line-scan imager via Fourier spectrum acquisition

Tianhua Fang, Jiajie Teng, Hongwei Chen, Qiang Guo, Minghua Chen, Sigang Yang, and Shihong Xie
AF2M.4 CLEO: Applications and Technology (CLEO:A&T) 2018

Indirect Imaging Using Virtualized Pattern Projection

Aparna Viswanath, Muralidhar M. Balaji, Prasanna Rangarajan, Duncan MacFarlane, and Marc P Christensen
CM2E.8 Computational Optical Sensing and Imaging (COSI) 2018

Glass Patterns Provide a Litmus Test for the Detection of Dotted Straight Lines in Noise

Godfried T. Toussaint
MM4C.5 Mathematics in Imaging (MATH) 2017

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved