Author Affiliations

Yuki Kumon,¹ Tomoyoshi Inoue,^1,2 Kenzo Nishio,³ Peng Xia,⁴ Manoj Kumar,⁵ Osamu Matoba,⁵ Sudheesh K. Rajput,⁶ and Yasuhiro Awatsuji^6,*

¹Graduate School of Science and Technology, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto, 606-8585, Japan

²Japan Society for the Promotion of Science, Kojimachi Business Center Building,5-3-1Kojimachi, Chiyoda-ku, Tokyo102-0083, Japan

³Advanced Technology Center, Kyoto Institute of Technology, Matsugasaki, Sakyo-ku, Kyoto, 606-8585, Japan

⁴National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba 305-8568, Japan

⁵Graduate School of System Informatics, Kobe University, Rokkodai 1-1, Nada, Kobe 657-8501, Japan

⁶Faculty of Electrical Engineering and Electronics, Kyoto Institute of Technology, Matsugasaki, Sakyo ku, Kyoto, 606-8585, Japan

^*Corresponding author: awatsuji@kit.ac.jp