Critical Dimensions for Axial Double Heterostructure Nanowires Using Finite-Element Method

Hui Geng; Xin Yan; Xia Zhang; Yongqing Huang; Xiaomin Ren

doi:10.1364/ACPC.2012.AF4A.7

Asia Communications and Photonics Conference
OSA Technical Digest (online) (Optica Publishing Group, 2012),
paper AF4A.7
•https://doi.org/10.1364/ACPC.2012.AF4A.7

Critical Dimensions for Axial Double Heterostructure Nanowires Using Finite-Element Method

Hui Geng, Xin Yan, Xia Zhang, Yongqing Huang, and Xiaomin Ren

Asia Communications and Photonics Conference 2012

Guangzhou China
7–10 November 2012
ISBN: 978-1-55752-957-2

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Poster Session I (AF4A)

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H. Geng, X. Yan, X. Zhang, Y. Huang, and X. Ren, "Critical Dimensions for Axial Double Heterostructure Nanowires Using Finite-Element Method," in Asia Communications and Photonics Conference, OSA Technical Digest (online) (Optica Publishing Group, 2012), paper AF4A.7.

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Abstract

Critical dimensions for an axial double heterostructure nanowire are studied by using finite-element method based on the energy equilibrium criteria. The results are in good agreement with the experimental data.

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