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Conferences > ACPC > 2014 > ATh3A > ATh3A.70

Loss characterization of Arrayed Waveguide Grating by Fabry-Perot Interferometric Method

Songtao Liu, Xilin Zhang, Dan Lu, Ruikang Zhang, Wei Wang, and Chen Ji

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Abstract

An improved measurement technique for characterizing the on-chip loss of InP-based arrayed waveguide grating is demonstrated. The results match well with that of the conventional test method, but with higher measurement efficiency and less uncertainties.

© 2014 Optical Society of America

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