Abstract
An improved measurement technique for characterizing the on-chip loss of InP-based arrayed waveguide grating is demonstrated. The results match well with that of the conventional test method, but with higher measurement efficiency and less uncertainties.
© 2014 Optical Society of America
PDF ArticleMore Like This
T. Saida, Y. Sakamaki, M. Tamura, M. Itoh, T. Hashimoto, and H. Takahashi
OWO2 Optical Fiber Communication Conference (OFC) 2006
Hyung M. Kim, Jeong S. Kim, Heung R. Choo, Dong C. Kim, Keun H. Yoo, Jeha Kim, Byung S. Ham, and Kwang E. Pyun
IFB4 Integrated Photonics Research (IPR) 2000
Zhonghua Zhu, Zhipeng Wang, Y. J. Chen, Wei Chen, Wenlu Chen, R. Davidson, O. King, D. Gill, F. Johnson, J. Hryniewicz, B. Little, Sai Chu, Shih-Jung Chang, and Yen Chu
CThS5 Conference on Lasers and Electro-Optics (CLEO) 2006