Abstract
To meet the needs of tunable EVM digital signal generator in the bit error rate measurements, an analytical relation between SNR and EVM is derived in theory.A system based on digital signal generator and White Gaussian noise generator is proposed. The output of the system test results show that the difference between the theory and the measured is no more than 4% relatively with a range of EVM from 1% to 10%, and the repeatability of the output is excellent with maximum standard deviation of 0.022%.
© 2018 The Author(s)
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