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Conferences > ACPC > 2020 > M4A > M4A.158
  • Asia Communications and Photonics Conference/International Conference on Information Photonics and Optical Communications 2020 (ACP/IPOC)
  • OSA Technical Digest (Optica Publishing Group, 2020),
  • paper M4A.158
  • •https://doi.org/10.1364/ACPC.2020.M4A.158

Wafer-level automatic testing of DFB lasers with active distributed reflector

Lei Xu, Jialin Yan, Gonghai Liu, Xiang Ma, Fan Yang, Qiaoyin Lu, Mingzhi Lu, and Weihua Guo

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Abstract

We achieved the wafer-level automatic testing of DFB lasers with active distributed reflector. We can test the entire two-inch wafer with nearly 18000 lasers in about 3 hours, i.e. 0.6 seconds for single laser test.

© 2020 The Author(s)

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