Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Terahertz multispectral imaging of multi-walled carbon nanotube films on silicon wafer

Not Accessible

Your library or personal account may give you access

Abstract

Terahertz multispectral imaging for sub-nanoscale investigation is utilized to determine the thicknesses of single-walled carbon nanotube films on silicon wafer. The measured thicknesses vary systematically as a function of alignment, as expected.

© 2019 The Author(s)

PDF Article
This paper was not presented at the conference

More Like This
Terahertz time-resolved linear spectroscopy of single-wall carbon nanotube films

Juraj Darmo, Josef Kröll, Karl Unterrainer, Martin Hulman, and Hans Kuzmany
JMB7 Conference on Lasers and Electro-Optics (CLEO:S&I) 2004

Terahertz optical devices by using single-walled carbon nanotube network films

J. T. Hong, S. Lee, and Y. H. Ahn
C1112 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 2011

Terahertz Transmission Properties of Super-Thin Free-standing Multi-walled Carbon Nanotubes Film

Yue Wang, Xin Liu, Li Ying Zhang, Jin Shuo Mei, Qian Liu, and Ying Zhang
IW3B.5 International Symposium on Ultrafast Phenomena and Terahertz Waves (ISUPTW) 2016

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved