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Characterizing Carrier Envelope Frequency Correlation from a Polarization Multiplexed Free Running Single-Cavity Dual-Comb Laser

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Abstract

Using a single f-2f interferometer, we measure the correlation between the carrier-envelope offset frequencies of the two combs generated in a polarization-multiplexed dual-comb laser. Noise is suppressed by 20 dB via the shared cavity architecture.

© 2023 The Author(s)

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