Abstract
The measurement of thin (L≅10 µm) non-linearity profile of thermally poled silica plate through the Maker fringe analysis proves to be dubious owing to the smallness of the range spanned by the internal angle of propagation 0; of the beam within the sample. Recently, D. Pureur et al. have proposed a prism- assisted device leading to an accessible range for θi from 45° to 84°. We demonstrate that a new hemispherical lens assisted device allows a large range (0-85°) of internal angle θi to be sampled with Fresnel loss roughly at minimum. Taking advantage of the technique, we show that the non-linearity profile within a thermally poled Suprasil I sample spreads over the volume of the 235 µm thick plate.
© 1999 Optical Society of America
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