Characterization of Integrated Bragg Grating Profiles

Alexandre D. Simard; Yves Painchaud; Sophie LaRochelle

doi:10.1364/BGPP.2012.BM3D.7

Advanced Photonics Congress
OSA Technical Digest (online) (Optica Publishing Group, 2012),
paper BM3D.7
•https://doi.org/10.1364/BGPP.2012.BM3D.7

Characterization of Integrated Bragg Grating Profiles

Alexandre D. Simard, Yves Painchaud, and Sophie LaRochelle

Bragg Gratings, Photosensitivity, and Poling in Glass Waveguides 2012

Colorado Springs, Colorado United States
17–20 June 2012
ISBN: 978-1-55752-946-6

From the session
Grating Properties and Fabrication: Novel Fibers and Grating Design (BM3D)

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A. D. Simard, Y. Painchaud, and S. LaRochelle, "Characterization of Integrated Bragg Grating Profiles," in Advanced Photonics Congress, OSA Technical Digest (online) (Optica Publishing Group, 2012), paper BM3D.7.

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Abstract

Spectral responses of gratings in SOI are extracted using time windowing to eliminate parasitic reflections. Filtering high spatial frequencies of the phase profile, obtained by layer peeling, allows examination of the wafer thickness uniformity.

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