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  • Bragg Gratings, Photosensitivity, and Poling in Glass Fibers and Waveguides: Applications and Fundamentals
  • Technical Digest Series (Optica Publishing Group, 1997),
  • paper JSuE.5
  • https://doi.org/10.1364/BGPPF.1997.JSuE.5

Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy

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Abstract

In recent years high-resolution microscopy has experienced the application of probe-based scanning techniques such as the scanning near field optical microscope1 (SNOM). In contrast to conventional optical far-field imaging, the SNOM utilizes a non-propagating (evanescent) nearfield, whereby the achievable lateral resolution overcomes the far-field diffraction limit of λ/2 where λ is the wavelength of the imaging light.

© 1997 Optical Society of America

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