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Picosecond optical electronic evaluation of solid-state devices

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Abstract

Recently1,2 it was demonstrated that high-defect-density materials such as amorphous and radiation-damaged semiconductors can be used to make thin film photoconducting detectors and electronic sampling gates with measured response times as fast as 4 psec. An electronic correlation technique has been developed2 using these devices to generate and measure electronic pulses with an overall time resolution of <10 psec.

© 1981 Optical Society of America

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