Abstract
Recently1,2 it was demonstrated that high-defect-density materials such as amorphous and radiation-damaged semiconductors can be used to make thin film photoconducting detectors and electronic sampling gates with measured response times as fast as 4 psec. An electronic correlation technique has been developed2 using these devices to generate and measure electronic pulses with an overall time resolution of <10 psec.
© 1981 Optical Society of America
PDF ArticleMore Like This
Hideaki Matsueda, Tadashi Fukuzawa, and Mschiharu Nakamura
WH1 Optical Fiber Communication Conference (OFC) 1981
A. M. JOHNSON, D. W. KISKER, and W. M. SIMPSON
TUK5 Conference on Lasers and Electro-Optics (CLEO:S&I) 1985
S. Williamson, S. Letzring, and G. Mourou
WR5 Conference on Lasers and Electro-Optics (CLEO:S&I) 1981