Abstract

Extended x-ray-absorption-fine-structure (EXAFS) is a tool of increasing importance for studying the structure of materials at the atomic level. EXAFS provides information on the identities and spatial arrangement of the atoms in solids, liquid or gas. In the EXAFS technique, the x-ray absorption coefficient of a material is measured as a function of energy above a K or L edge. The fine structure in this spectrum yields information on the distances of neighboring atoms. A very intense, high-brightness x-ray source is required for practical EXAFS. The energy range corresponding to K or L edges of atoms with atomic numbers up to 40 is ¹/₂ to 3 keV. This energy range is well suited to laser-plasma x-ray sources.^1,2

© 1982 Optical Society of America