Abstract

Hg_1−xCd_x Te is an important material for IR detectors. The x value (fraction of Cd in the alloy) determines the forbidden energy gap and thus controls the semiconductor properties. Unfortunately, segregation during crystal growth gives rise to compositional nonuniformities; i.e., the x value varies spatially in a given sample. Thus an ability to measure the spatial variations of the x value and transmission is important for successful detector fabrication.

© 1982 Optical Society of America