Abstract
We report on an etectrooptic sampling system capable of noninvasive measurements in GaAs integrated circuits.1 The circuits can be excited by either onboard photodetectors for impulse response measurements or external signal generators phase-locked to the laser pulse train for swept frequency measurements.
© 1985 Optical Society of America
PDF ArticleMore Like This
B.H. Kolner, K.J. Weingarten, and D.M. Bloom
WB4 Picosecond Electronics and Optoelectronics (UEO) 1985
J. P. Donnelly, N. L. DeMeo, G. A. Ferrante, K. B. Nichols, and F. J. O'Donnell
ThB3 Integrated and Guided Wave Optics (IGWO) 1984
Richard F. Carson and Ted E. Batchman
WP1 OSA Annual Meeting (FIO) 1985