Photothermal methods for material testing applications

Andrew C. Tam

doi:10.1364/CLEO.1986.MI1

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1986),
paper MI1
•https://doi.org/10.1364/CLEO.1986.MI1

Photothermal methods for material testing applications

Andrew C. Tam

Conference on Lasers and Electro-Optics 1986

San Francisco, California United States
9–13 June 1986
ISBN: 0-936659-09-2

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Optical Testing and Inspection (MI)

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A. C. Tam, "Photothermal methods for material testing applications," in Conference on Lasers and Electro-Optics, G. Bjorklund, E. Hinkley, P. Moulton, and D. Pinnow, eds., OSA Technical Digest (Optica Publishing Group, 1986), paper MI1.

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Abstract

Photothermal (PT) methods rely on the detection of heating due to optical absorption in a sample. These methods include photoacoustics (PA), calorimetry, thermal lensing, probe beam refraction, probe beam deflection, reflectivity, and radiometry measurements as affected by the modulated PT heating.

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