Photoelectron electron microscope for high-speed IC testing

PAUL MAY; JEAN-MARC HALBOUT; GEORGE CHIU

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Conferences > CLEO > 1987 > FN > FN4

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1987),
paper FN4

Photoelectron electron microscope for high-speed IC testing

PAUL MAY, JEAN-MARC HALBOUT, and GEORGE CHIU

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PAUL MAY, JEAN-MARC HALBOUT, and GEORGE CHIU

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P MAY
J HALBOUT
G CHIU

Conference on Lasers and Electro-Optics 1987

Baltimore, Maryland United States
26 April–1 May 1987
ISBN: 0-936659-49-1

From the session
Ultrafast Optoelectronic Sampling (FN)

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P. MAY, J. HALBOUT, and G. CHIU, "Photoelectron electron microscope for high-speed IC testing," in Conference on Lasers and Electro-Optics, D. Auston, R. Jacobs, R. Bartolini, and P. Liao, eds., Vol. 14 of OSA Technical Digest (Optica Publishing Group, 1987), paper FN4.

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