Abstract
Surface plasma waves (SPWs) and guided resonant waves provide a sensitive method for measuring small variations of the refractive index and the thickness of dielectric thin films for obtaining the electrooptic properties of polymer films. The Kretschmann and Raether1 attenuated total reflection method has been used with two ferroelectric copolymers: vinylidene fluoride/trifluoroethylene and vinylidene cyanide/vlnyle acetate. A glass prism is coated with a multilayer structure (Fig. 1) consisting of a thin silver layer, a ferroelectric polymer film (FEPF), and an aluminium layer. Through the prism, a linearly polarized (p = TM or s = TE) He-Ne laser beam is reflected on the multilayered structure. By rotating the prism about an axis perpendicular to the plane of incidence, a surface plasma wave (TM only) and guided modes (TM or TE) are excited at different angles of incidence. These modes are seen as sharp minima in the reflectivity vs angle curves.2 The FEPF thickness (~2 µm) allows the existence of a few guided modes.
© 1989 Optical Society of America
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