Abstract

The development of a coherent field-emission electron beam has facilitated practical applications of electron interferometry.^1,2 Using Möllenstedt type electron biprism,³ the phase distribution of the electron beam transmitted through a specimen can be displayed as an interference micrograph by combining an optical interferometer in the optical reconstruction stage of electron holography. Furthermore, the phase distribution has now become measurable to a precision of 1/100 of the wavelength using the phase amplification technique peculiar to electron holography. The contour fringes have been proven to follow in-plane magnetic lines of force in h/e flux units for a magnetic sample.

© 1991 Optical Society of America