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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1991),
  • paper JMC1

Applications of holographic electron interferometry

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Abstract

The development of a coherent field-emission electron beam has facilitated practical applications of electron interferometry.1,2 Using Möllenstedt type electron biprism,3 the phase distribution of the electron beam transmitted through a specimen can be displayed as an interference micrograph by combining an optical interferometer in the optical reconstruction stage of electron holography. Furthermore, the phase distribution has now become measurable to a precision of 1/100 of the wavelength using the phase amplification technique peculiar to electron holography. The contour fringes have been proven to follow in-plane magnetic lines of force in h/e flux units for a magnetic sample.

© 1991 Optical Society of America

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