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  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1993),
  • paper CThS88

Characterization of microchannel-plate detectors for high-speed gated x-ray imaging by electro-optic sampling

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Abstract

A widely used device for diagnosing laser- driven inertial-confinement fusion experiments isbased on the high-speed x-ray gating of a proximity focused microchannel-plate (MCP) detector.1 The MCP is a nonhomogeneous air/glass dielectric medium that provides extremely high (nonlinear) electron gain. For gating applications, a microstrip line is fabricated by coating a 1-6.55-mm-wide, 500-nm-thick Au/Cu center conductor on the front and a 500-nm-thick Au/Cu ground plane on the back of the MCP, A short (<100-ps) high-voltage pulse is propagated along this microstrip, resulting in a localized gating on the MCP wherever the voltage is applied (Fig. 1).

© 1993 Optical Society of America

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