Abstract
Recently, it has been observed that the explosive vaporization of a liquid film at a solid surface can be efficiently used to remove submicron-sized particles from the surface.1–3 Here, we present the application of the optical reflectance and scattering techniques and piezoelectric monitoring to study the transient behavior of this phenomenon.
© 1993 Optical Society of America
PDF ArticleMore Like This
Hee K. Park, Costas P. Grigoropoulos, Oguz Yavas, Wing P. Leung, Chie C. Poon, and Andrew C. Tam
CFI1 Conference on Lasers and Electro-Optics (CLEO:S&I) 1994
Hee K. Park, Costas P. Grigoropoulos, Oguz Yavas, Wing P. Leung, Chie C. Poon, and Andrew C. Tam
CMB5 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 1994
Oguz Yavas, Paul Leiderer, Hee K. Park, Costas P. Grigoropoulos, Chie C. Poori, and Andrew C. Tam
CFI6 Conference on Lasers and Electro-Optics (CLEO:S&I) 1994