Abstract
In this paper we report gam measurements in strained and non-strained ternary and strained quaternary InGaAsP quantum, well material. The material investigated was grown by GSMBE and MOCVD and processed into broad area lasers. Gain measurements derived from the spontaneous emission transverse to the laser cavity were made based on a technique developed by Henry.1 A more complete description of this technique applied to InGaAs quantum well material is presented elsewhere.2
© 1993 Optical Society of America
PDF ArticleMore Like This
Shunji Seki, Takayuki Yamanaka, Kiyoyuki Yokoyama, Paul Sotirelis, and Karl Hess
IWB2 Integrated Photonics Research (IPR) 1993
M. Silver, G. Jones, V. A. Wilkinson, and E. P. O’Reilly
CTuN16 Conference on Lasers and Electro-Optics (CLEO:S&I) 1993
E. C. Vail, S. F. Lim, Y.-A. Wu, D. A. Francis, C. J. Chang-Hasnain, R. Bhat, C. Caneau, and H. Leblanc
WH16 Optical Fiber Communication Conference (OFC) 1993