Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group
Conferences > CLEO > 1995 > CFN > CFN7
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1995),
  • paper CFN7

Highly sensitive laser profile analysis of solid samples

A. A. Petrov, S. V. Oshemkov, E. O. Artamonova, O. N. Ezhov, V. E. Evtiheev, and O.V. Khait

Not Accessible

Your library or personal account may give you access

Abstract

Three variants of combined techniques for determination of profile elements' concentrations both on the surface and in the volume of solid samples (dielectrics, semiconductors, metals and alloys) without any sampling were realized.

© 1995 Optical Society of America

PDF Article
More Like This
Surface analysis of solid samples through laser desorption and ion mass spectroscopy

E Fuso, L. Ceresara, F. Ciabattati, A. Diodati, M. Allegrini, E. Arimondo, V. Berardi, and N. Spinelli
CThO2 Conference on Lasers and Electro-Optics (CLEO:S&I) 1995

Extremely sensitive element analysis by laser ablation atomic fluorescence spectroscopy

Yuji Oki and Mitsuo Maeda
P31 Conference on Lasers and Electro-Optics/Pacific Rim (CLEO/PR) 1995

Analysis of trace element in solids by using laser ablation atomic fluorescence spectroscopy

M.-K. Kim, H. Ishii, T. Takao, Y. Oki, and M. Maeda
CThO4 Conference on Lasers and Electro-Optics (CLEO:S&I) 2000

View More...
Select as filters
Select Topics Cancel
Top
       
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.
Privacy | Terms of Use