Novel interferometer using a two-color laser-diode array and the second-order-correlation technique

Chi-Luen Wang; Ci-Ling Pan

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1995),
paper CFN8

Novel interferometer using a two-color laser-diode array and the second-order-correlation technique

Chi-Luen Wang and Ci-Ling Pan

Conference on Lasers and Electro-Optics 1995

Baltimore, Maryland United States
21–26 May 1995
ISBN: 1-55752-400-9

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Laser Diagnostics (CFN)

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C. Wang and C. Pan, "Novel interferometer using a two-color laser-diode array and the second-order-correlation technique," in Conference on Lasers and Electro-Optics, T. Deutsch, J. Goldsmith, D. Killinger, and G. Valley, eds., Vol. 15 of OSA Technical Digest (Optica Publishing Group, 1995), paper CFN8.

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Abstract

Two-wavelength interferometry is attractive for absolute distance measurements because the range of unambiguity can be extended by employing a longer synthetic wavelength.¹ The interference signal at the synthetic wavelength is usually determined by simultaneously measuring the phase at both wavelengths.²

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