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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1995),
  • paper CThR4

Picosecond electric on-wafer testing with freely positionable photoconductive switches

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Abstract

Subpicosecond electric pulses can be generated by means of photoconductive (PC) switches illuminated with ultrashort laser pulses. Detection beyond the limits of electronic techniques is achieved through electro-optic (EO) sampling or PC sampling techniques. PC-sampling. The sensitivity of PC sampling, however, exceeds that of EO sampling by orders of magnitude at the penalty of a somewhat reduced time resolution. Recently, freely positionable PC probes that can be connected to any electrically accessible point in an electric circuit have been introduced as detectors.1,2 In this paper we demonstrate the capability of freely positionable PC switches to both detects and generate picosecond electric transients.

© 1995 Optical Society of America

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