Abstract
Thin-film photorefractive gratings in the transverse field geometry have been studied extensively.1−3 Usually, one-dimensional transport equations were used to predict its device performance. However, the thin film edge effects were shown significant by Aguilar et al. recently,4 which indicates the important role of the 2-D nature of the device. In this summary, we will propose a new model, which includes the thin thickness effect and shows the qualitative difference between the two-dimensional structure and its 3-D counterpart.
© 1996 Optical Society of America
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