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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1996),
  • paper CWP1

Application of optical coherence tomography in nondestructive evaluation of material microstructure

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Abstract

Techniques for nondestructive evaluation (NDE), testing, and inspection of parts during manufacturing and processing, in situ, or during design, is a key technology. Over the past decade there have been tremendous advances in NDE technology to address the wide range of research, industrial, and DoD needs. For example, ultrasound, CT, MRI, and optics all have important NDE applications in a wide range of industries. However, there are still many situations where existing technology is inadequate. This is particularly true where high resolution (~1 µm) microstructural information is required. Visualization at this level often requires the costly and enormously time consuming process of destructive evaluation (microtome sectioning) and subsequent microscopic evaluation; or are limited to very short penetration depths (<100 µm). There are many important applications where such destructive evaluation is not possible or practical, and conventional imaging techniques lack the sensitivity, resolution, and/or speed for definitive microstructural in-process or in situ analysis.

© 1996 Optical Society of America

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