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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 1996),
  • paper CWP2

Subsurface defect detection in ceramic materials using an optical gated scatter reflectometer

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Abstract

The utility of advanced ceramic materials in industrial and military applications can be limited by the presence of defects in the bulk, on the surface, and in the subsurface regions of the ceramic. These defects may be inherent or introduced at various stages of the manufacturing process and considerable effort has been expended in developing techniques to detect these flaws. Defects at or just below the surface are particularly critical because operational stresses there can, be greatest.

© 1996 Optical Society of America

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