Nano-material processing by combination of laser with scanning probe technology

Klaus Dickmann; Johann Jersch; Frank Demming; Jens Hildenhagen

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1997),
paper CTuK2

Nano-material processing by combination of laser with scanning probe technology

Klaus Dickmann, Johann Jersch, Frank Demming, and Jens Hildenhagen

Conference on Lasers and Electro-Optics 1997

Baltimore, Maryland United States
18–23 May 1997
ISBN: 1-55752-498-8

From the session
Nanoscale Material Processing (CTuK)

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
K. Dickmann, J. Jersch, F. Demming, and J. Hildenhagen, "Nano-material processing by combination of laser with scanning probe technology," in Conference on Lasers and Electro-Optics, D. Killinger, G. Valley, C. Chang-Hasnain, and W. Knox, eds., Vol. 11 of OSA Technical Digest (Optica Publishing Group, 1997), paper CTuK2.

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Save article

Abstract

In the near-field of a laser-illuminated scanning probe tip a tremendous local intensity enhancement up to 10⁶ is possible.

PDF Article

More Like This

Nanostructure fabrication with laser radiation in the nearfield of a scanning-probe microscope tip

J. Jersch and K. Dickmann
CThQ3 Conference on Lasers and Electro-Optics (CLEO:S&I) 1996

Picosecond/nanometer resolution with a near-field microwave/scanning-force microscope

D. W. van der Weide
UE8 Ultrafast Electronics and Optoelectronics (UEO) 1997

Femtosecond laser materials processing

B. C. Stuart, M. D. Perry, M. D. Feit, L. B. Da Silva, A. M. Rubenchik, J. Neev, S. Herman, H. Nguyen, and P. Armstrong
CTuR1 Conference on Lasers and Electro-Optics (CLEO:S&I) 1997

Previous Article Next Article