Characterization of a laser-scanning microscope in the femtosecond regime

R. Wolleschensky; T. Feurer; R. Sauerbrey; K. König; K. König; U. Simon; U. Simon

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1997),
paper CTuP64

Characterization of a laser-scanning microscope in the femtosecond regime

R. Wolleschensky, T. Feurer, R. Sauerbrey, K. König, and U. Simon

Conference on Lasers and Electro-Optics 1997

Baltimore, Maryland United States
18–23 May 1997
ISBN: 1-55752-498-8

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CLEO Poster Session: 1 (CTuP)

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R. Wolleschensky, T. Feurer, R. Sauerbrey, K. König, and U. Simon, "Characterization of a laser-scanning microscope in the femtosecond regime," in Conference on Lasers and Electro-Optics, D. Killinger, G. Valley, C. Chang-Hasnain, and W. Knox, eds., Vol. 11 of OSA Technical Digest (Optica Publishing Group, 1997), paper CTuP64.

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Abstract

The combination of femtosecond laser systems and a laser-scanning microscope leads to a variety of interesting applications, such as two photon microscopy.¹

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