Error bars in intensity and phase measurements of ultrashort laser pulses

Michael Munroe; David H. Christensen; Rick Trebino; Rick Trebino

Conference on Lasers and Electro-Optics
(Optica Publishing Group, 1998),
paper CThW2

Error bars in intensity and phase measurements of ultrashort laser pulses

Michael Munroe, David H. Christensen, and Rick Trebino

Conference on Lasers and Electro-Optics 1998

San Francisco, California United States
3–8 May 1998
ISBN: 1-55752-540-4

From the session
Pulse Characterization Using Frequency-resolved Optical Gating (CThW)

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M. Munroe, D. H. Christensen, and R. Trebino, "Error bars in intensity and phase measurements of ultrashort laser pulses," in Conference on Lasers and Electro-Optics, D. Scifres and A. Weiner, eds., (Optica Publishing Group, 1998), paper CThW2.

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Abstract

How does one place error bars on a measurement of an ultrashort laser pulse? For many years, the only available measure of an ultrashort laser pulse was the autocorrelation.

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