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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • (Optica Publishing Group, 1998),
  • paper CWF22

Analysis of current spreading in long-wavelength, vertical-cavity, surface-emitting lasers

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Current spreading is a major concern for wafer-bonded 1.3-μm and 1.55-μm vertical-cavity, surface-emitting lasers (VCSELs) because the distance between the active layer and the aperture for wafer-bonded VCSELs is significantly greater than that for shorter wavelength VCSELs.

© 1998 Optical Society of America

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