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Conferences > CLEO > 1998 > CWF > CWF51
  • Conference on Lasers and Electro-Optics
  • (Optica Publishing Group, 1998),
  • paper CWF51

Measurements with an ultrafast scanning tunneling microscope on photoexcited semiconductor layers

Ulrich D. Keil, Jacob R. Jensen, and Jørn M. Hvam

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Abstract

Thus far, the photoconductively gated ultra-fast scanning tunneling microscope (USTM) has only been demonstrated on transmission lines.1-3

© 1998 Optical Society of America

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