Phase spectroscopy in semiconductor structures

M. V. Marquezini; J. Tignon; T. Hasche; D. S. Chemla

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 1999),
paper CWL3

Phase spectroscopy in semiconductor structures

M. V. Marquezini, J. Tignon, T. Hasche, and D. S. Chemla

Conference on Lasers and Electro-Optics 1999

Baltimore, Maryland United States
23–26 May 1999
ISBN: 1-55752-570-6

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Ultrafast Material Dynamics (CWL)

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M. V. Marquezini, J. Tignon, T. Hasche, and D. S. Chemla, "Phase spectroscopy in semiconductor structures," in Conference on Lasers and Electro-Optics, C. Chang-Hasnain, W. Knox, J. Kafka, and K. Vahala, eds., OSA Technical Digest (Optica Publishing Group, 1999), paper CWL3.

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Abstract

We present applications of phase/amplitude spectroscopy in GaAs-based semiconductor structures, using Fourier Transform Spectral lnterferometry.¹

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