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Conferences > CLEO > 2000 > CMT > CMT1
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2000),
  • paper CMT1

Displacement measurement with submicron resolution using photoelectromotive force effect and frequency-modulated lasers

F. Jin, J. B. Khurgin, C.-C. Wang, S. Trivedi, Y. Gabay, E. Gad, D. A. Temple, and U. H. Hommerich

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Abstract

Two noncollinear coherent light waves interfering inside a semi-insulating semiconductor form an optical pattern (grating). Transient photo-electromotive force (photo-emf) current can be generated when the phase of the grating is changed.1

© 2000 Optical Society of America

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