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Conferences > CLEO > 2000 > CWA > CWA5
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2000),
  • paper CWA5

Defect recognition via longitudinal mode analysis of high power broad area QW semiconductor lasers

A. Klehr, G. Beister, G. Erbert, A. Klein, A. Knauer, J. Maege, I. Rechenberg, P. Ressel, J. Sebastian, H. Wenzel, and G. Tränkle

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Abstract

The lifetime of semiconductor quantum well (QW) lasers is limited by the formation of defects at the facets or in the bulk of the activie region.

© 2000 Optical Society of America

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