Polarized optical heterodyne laser scanning microscope

Chien Chou; Chung-Wei Lyu; Li-Cheng Peng; Sheau-Shi Pan; Sheau-Shi Pan

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2001),
paper CWN2

Polarized optical heterodyne laser scanning microscope

Chien Chou, Chung-Wei Lyu, Li-Cheng Peng, and Sheau-Shi Pan

Conference on Lasers and Electro-Optics 2001

Baltimore, Maryland United States
6–10 May 2001
ISBN: 1-55752-662-1

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Optical Diagnostics and Novel Effects (CWN)

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C. Chou, C. Lyu, L. Peng, and S. Pan, "Polarized optical heterodyne laser scanning microscope," in Conference on Lasers and Electro-Optics, J. Kafka, K. Vahala, R. Williamson, and A. Willner, eds., OSA Technical Digest (Optica Publishing Group, 2001), paper CWN2.

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Abstract

Optical heterodyne interferometry is widely used in the measurements of surface topography.^1–2

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