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Conferences > CLEO > 2002 > CMT > CMT7
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2002),
  • paper CMT7

Optimized Metrology for Accurate Laser Damage Measurements

L. Gallais and J. V. Natoli

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Abstract

Laser Induced Damage Threshold is linked to many factors such as the damage criteria,1 test procedure,2 pulse duration,3−5 spot size,3,6 wavelength4 . . . This induces difficulty to make comparisons, or compilations of results and reach on an absolute measurement. This absolute measurement of laser damage requires a high level of sensitivity and a perfect knowledge of the apparatus characteristics. In this context we have upgrade the metrology of our set up8 to control and know the influence of each parame ter on laser-induced damage threshold measurement.

© 2002 Optical Society of America

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