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Optica Publishing Group
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2002),
  • paper CTuR7

Characterization of PVK-based Photorefractive Polymers by Photo-EMF Technique in Reflectance Configuration

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Abstract

Characterization of photorefractive polymer films is a complicated problem because of the dependence of many relevant parameters, such as photocarriers generation rate, their life-time, and diffusion length, on the external field E0. Especially difficult are investigations at low E0 values, where holographic measurements are not reliable because of low diffraction efficiency. We report experimental data on characterization of a polymer film in photo-EMF configuration, 1 which allows us to probe the space-charge grating even without application of the external field.

© 2002 Optical Society of America

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