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Conferences > CLEO > 2002 > JTuD > JTuD1
  • Conference on Lasers and Electro-Optics
  • OSA Technical Digest (Optica Publishing Group, 2002),
  • paper JTuD1

Femtosecond X-ray Diffraction of Short- pulse Irradiated Semiconductors

Craig W. Siders, A. Cavalieri, Cs. Tóth, K.R. Wilson (posthumously), J.A. Squier, C. P.J. Barty, M. Kammler, K. Sokolowski-Tinten, M. Horn von Hoegen, and D. von der Linde

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Abstract

Ultrafast optical-pump, x-ray diffraction probe experiments (see figure 1) are providing new ways to study transient processes in physics, chemistry, and biology, including the direct observation of the atomic motion by which many solid-state processes and chemical and biochemical reactions take place. Current table-top-terawatt femtosecond laser systems provide an attractive source of few-hundred femtosecond duration bursts of angstrom-scale x-ray radiation with fluxes comparable to standard rotating- anode sources.1

© 2002 Optical Society of America

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