Abstract
Ultrashort x-ray pulses offer a unique combination of atomic-scale spatial and temporal resolution, which permits direct measurements of structural transients on an ultrafast time scale. Using time-resolved X-ray diffraction with femtosecond, multi-keV X-ray pulses we have studied transient lattice dynamics in optically excited semiconductors and metals.
© 2002 Optical Society of America
PDF ArticleMore Like This
K. Sokolowski-Tinten, C. Blome, C. Dietrich, J. Blums, M. Horn-von-Hoegen, D. von der Linde, A. Cavalleri, J. Squier, and M. Kammler
MB2 International Conference on Ultrafast Phenomena (UP) 2002
K. Sokolowski-Tinten, C. Blome, C. Dietrich, A. Tarasevitch, M. Horn-von-Hoegen, D. von der Linde, A. Cavalleri, J. Squier, and M. Kammler
TuD2 Applications of High Field and Short Wavelength Sources (HFSW) 2001
K. Sokolowski-Tinten, C. Blome, C. Dietrich, A. Tarasevitch, M. Horn-von-Hoegen, D. von der Linde, A. Cavalieri, J. Squier, I. Uschmann, E. Förster, and M. Rammler
CPD18 Conference on Lasers and Electro-Optics (CLEO:S&I) 2001